our vision

100x times faster

Use the shinephi imager to enable real-time nano-characterization. Image: 2D semiconductor material on silicon wafer analized with an AFM (left) and a shinephi imager connected to an optical microscope (right)

100x higher contrast

Connect the shinephi imager to a classical optical microscope to obtain more information from highly transparent samples. Image: Hippocampal neuron of a rat analized under an optical microscope at 20x magnificationwith a scientific camera (left) and a shinephi imager (right)

Push the limits of speed and sensitivity

Our imagers transform a standard imaging system into a high-performance metrology tool with sub-nanometric depth sensitivity in real-time. Image: Microarray of silica squares evaporated on glass (2nm thick, 1nm OPD). Classical transmission image (left), shinephi's phase image (right)

Ultra-thin materials

Follow the nano-fabrication processes of coatings and ultra-thin materials ensuring quality control and timely defect detection. Image: Microarray of silica squares evaporated on glass (10nm thick, 5nm OPD). Classical transmission image (left), shinephi's phase image (right)

Quantitative phase & amplitude

Get the full picture of the optical properties of your sample in a single measurement. Image: Transparent glass substrate and silica nanostructures (15nm thickness, 7.5nm OPD)

Development of novel semiconductor materials

The shinephi imagers help you find structures of interest within a larger area, offering high contrast and visibility. Image: few-layer flakes of hexagonal boron nitride on silicon

Transparent electronics and optics

Perform real-time optical quality control of highly transparent capacitive structures in touch-screen devices.

Analyze dynamic process

Take advantage of our high acquisition rates to analize dynamic processes. Image: Live HeLa cells, without fluorescent labelling.

High performance with large field-of-view

Observe the structure in hippocampal neurons with the shinephi phase imager, regardless of the magnification. Image: Hippocampal neuron of a rat analized under an optical microscope at 5x magnificationwith a shinephi imager

Integration with optical microscopes

Our interferometric imagers and user-friendly software seamlessly transform your classical optical microscope into a high-throughput, ultra-sensitive metrology tool. Image: shinephi imager connected to the camera port of a Carl-Zeiss microscope

Integration with optical microscopes

Our patented imager has been designed and built to be compatible with most optical systems for a seamless integration with current solutions used by microscopy leaders, without any special illumination or vibration control. Image: shinephi imager connected to the camera port of a Nikon microscope with standard halogen illumination

Integration with AFM

shinephi effortlessly integrates with high-end characterization platforms like AFM, providing fast optical analysis with a nanometric depth resolution and allowing accurate characterization of structures embedded in transparent materials. Image: Custom integration of a shinephi imager with a NX10 atomic force microscope from Park Systems