Real-time, nanoscale optical metrology
for advanced manufacturing and R&D.
Designed as an add-on. Built to meet your needs.
Sensitive like an AFM, versatile like an
optical system. No trade-offs.
Critical nanoscale surface variations go undetected with conventional techniques.
AFMs can only characterize limited areas while optical microscopes struggle to image reliably structures thinner than λ/30.
shinephi merges AFM-level detection with optical imaging versatility reaching sub-nm vertical sensitivity with large field of view.
Non-contact metrology at high-speed.
See everything. Damage nothing.
If your measurement tools can’t keep up, your research slows down.
Long scan cycles and destructive techiques force labs to measure less, later, and with lower statistical confidence.
As an add-on to existing microscopes, shinephi delivers quantitative information of nano-scale structures up to 50 fps, enabling routine screening without damaging samples.
Upgrade your microscope.
Boost the assets you already own.
Labs are forced to buy a new platform just to reach higher-performance metrology.
Standalone upgrades often require a new instrument platform. shinephi provides the upgrade as an add-on at 10x lower cost than other nanocharacterization solutions, maximizing the value of microscopes already in the lab.
High-throughput inspection.
Zero damage.
Traditional inspection methods force a sampling approach that reacts to failures rather than preventing them.
Slow and destructive techniques prevent full-wafer screening, leaving critical areas uninspected.
By enabling rapid, non-destructive measurements, shinephi allows manufacturers to inspect full wafers without sacrificing devices.
Catch nanoscale deviations before they
become defects. Detect the trend.
Late drift detection turns small deviations into costly yield excursions.
With routine inspection often limited to /about/10-50 nm vertical sensitivity, early drift goes undetected until defects appear. shinephi offers a vertical sensitivity down to 0.1 nm, allowing immediate corrective action.
Boost your capabilities. Reduce complexity.
Immediate production line upgrade.
Beyond the CapEx, standalone tools drain floor space and require specialized operators.
Standalone metrology consumes valuable floor space, budget, and operational overhead. integrates as an add-on to existing stations, upgrading your line without disrupting the workflow while delivering measurements unaffected by vibrations.
Add a premium metrology upgrade to your existing portfolio.
Differentiate without redesign.
Platform upgrades are slow.
Your customers’ roadmap isn’t.
Building new performance into the base platform typically requires redesign, validation, and long release cycles. shinephi integrates as an add-on module, allowing OEMs to immediately launch differentiated configurations across current models while providing a straightforward retrofit and upgrade path for the installed base.
High-throughput inspection.
Zero damage.
Traditional inspection methods force a sampling approach that reacts to failures rather than preventing them.
Slow and destructive techniques prevent full-wafer screening, leaving critical areas uninspected.
By enabling rapid, non-destructive measurements, shinephi allows manufacturers to inspect full wafers without sacrificing devices.
Catch nanoscale deviations before they
become defects. Detect the trend
Late drift detection turns small deviations into costly yield excursions.
With routine inspection often limited to /about/10-50 nm vertical sensitivity, early drift goes undetected until defects appear. shinephi offers a vertical sensitivity down to 0.1 nm, allowing immediate corrective action.
About shinephi
shinephi is a deep-tech company redefining how nanoscale processes are monitored and controlled.
We have been recognized as Catalan Startup of the Year 2025.
We provide advanced solutions for Nanotechnology research
Traditional characterization forces a trade-off between speed and resolution, while production inspection is frequently offline, revealing defects only after a full batch is complete.
We bring to the table a new cutting-edge technology:
Real-Time Nanoscale Metrology.
shinephi delivers a compact, modular imaging add-on tool directly installed on your equipment, that transforms standard optical microscopes into high-stability, high-sensitivity metrology systems.
Get in touch with our Team!
Where to find us
Corporate Office
Parc Mediterrani de la Tecnologia,
edifici RDIT
Carrer Esteve Terradas, 1
08860 Castelldefels, Spain