<p>To revolutionise live-cell imaging with our ultra-sensitive, easy-to-use and easy-to-integrate phase-imaging technology, allowing its users to see beyond limits</p>
ShinePhi

Our Vision

To revolutionise live-cell imaging with our ultra-sensitive, easy-to-use and easy-to-integrate phase-imaging technology, allowing its users to see beyond limits

Discover
Ultra-sensitive and ultra-stable phase imagers
Solutions

Ultra-sensitive and ultra-stable phase imagers

  • Add-on
    Versatile and easy-to-integrate imager that converts standard optical microscopes into ultra-sensitive phase imaging tools, without compromising their stability or resolution.
  • Standalone
    Fully integrated and compact imager for ultra-sensitive and ultra-stable phase imaging without the need of any additional equipment.
Applications

make it visible!

Innovation

Label-free Intermerometric Imaging (LIM)

Our technology is based on a patented common-path differential interferometer and is built with consumer electronic components.

Together with our proprietary software algorithms, shinephi allows ultra-sensitive imaging of micro and nanostructures in transparent electronics and optical elements, as well as live cells.

shinephi performs with an exceptional stability against environmental changes, is compact and highly compatible, to meet the requirements of most sensitive imaging applications in material and life sciences.

Label-free Intermerometric Imaging (LIM)

Projects using the shinephi technology

  • Scalable, point-of-care and label free microarray for rapid detection of Sepsis

    Scalable, point-of-care and label free microarray for rapid detection of Sepsis

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  • Quantum-enhanced on-chip differential interference contrast microscopy

    Quantum-enhanced on-chip differential interference contrast microscopy

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  • Sepsis-screening platform based on lens-free interferometric microscopy

    Sepsis-screening platform based on lens-free interferometric microscopy

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  • Large area interferometric imager for highly sensitive inspection of materials

    Large area interferometric imager for highly sensitive inspection of materials

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